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*On SAS U.S. Corporate site

High-Performance Data Analysis with JMP Software

Date: Tuesday, November 14, 2006
Time: 8:00am - 1:15pm (Lunch included)
Cost: FREE

Location: Marriott San Diego Del Mar
11966 El Camino Real, San Diego, CA


National Semiconductor Corporation has a very data rich environment and many employees who need to analyze data effectively. The combination of employees, data, and JMP state-of-the-art software enables easy analysis and sound engineering decisions. In 2003, NSC started a Six Sigma deployment with objectives to improve the bottom line and increase customer satisfaction. JMP was the analytical software of choice and more than one hundred Master Black Belts, Black Belts, and Green Belts have been trained to use JMP. The initiative has saved the company tens of millions of dollars.

How does National Semiconductor use JMP both inside and outside the Six Sigma sphere? How does the company train non-Six Sigma practitioners to use JMP? Six Sigma modular courses, developed by Thomas A Little Consulting, simplify the learning process for NSC’s diverse engineering community.

This presentation will focus on various project examples and will highlight how JMP is used at NSC.

  • Customer Return Process Improvement. A transactional type of project championed by the Worldwide Quality Network where the Tables and Distribution platforms made the analysis quick and easy.
  • Statistical Yield Analysis. Applying statistical technique of identifying a wafer or wafer lot that exhibits unusually low yield or an unusually high bin failure rate. JMP is used to analyze non-normal distributions and the extent of wafer scrap if 3 or 4 sigma limits are used.
  • Electrical Test (ET) Alignment. JMP script was used on data extracted from National's data repository to provide a web based system that monitors ET alignment on multi-sourced processes.
  • VIP050 & VIP010 Variation Reduction. Tighter specifications are necessary for these products to compete in the precision analog arena. Fit Y by X, REML Variance Component Estimates & Custom DOE platforms were used extensively.

Agenda*

Time Event  
8:00 am Registration and Continental Breakfast Register
8:30 am Welcome and General Session
Chuck Boiler, JMP
 
9:15 am The Use and Value of JMP at National Semiconductor
Lorena Dudman and Dr. Michael E. Haslam, National Semiconductor
 
11:00 am Networking Lunch  
Noon Closing Remarks  
12:15 pm Q & A Session with JMP Technical Staff (optional)  
1:15 pm Adjourn  

* Agenda subject to change without notice.

 
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