Semiconductors
JMP’s comprehensive statistics and interactivity offer design, yield, test, process, quality, and reliability engineering workgroups a standard tool for seeing structure in their data, analyzing manufacturing processes, and exploring opportunities through designed experiments. JMP supports problem solving and yield improvement programs around existing products and technologies, and can be used to guide and inform product revisions and new product and technology development and transfer.
Comprehensive statistics and interactivity for design, yield, test, process, and reliability engineering
Dynamic linking between graphs, plots, and data let you understand the structure of complex data better and more quickly. |
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| JMP’s Experimental Design and Gage R&R modern methods fit the design to the problem, not the other way around and prediction profilers let you interact with the model to understand your results. |  |
| Use JMP Journals to define standardized workflows for Process Change Requests and Equipment Qualifications and to capture and consolidate their output for review. |  |
Use JMP Scripting Language to easily automate tasks, repackage and publish output, or even extend JMP. |
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“JMP’s analytical component is superior to the other software packages we considered. We analyzed the same data with several statistical analysis packages and found that JMP provided a more comprehensive solution for our needs. All of our manufacturing sites are using JMP, and we found that deployment was faster from both an ease-of-use and technical standpoint.”
Mark Seay
Director of Quality
National Semiconductor
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