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Alphabetical List of Features

This list is a guide to JMP features. Where appropriate, the feature is followed by the name of the platform where the feature is found. Newest features are bold.

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A

ABCD design—screening design for mixtures, DOE, Mixture Design
Accelerated failure—parametric survival models, Fit Model > Parametric Survival
actuarial life table templates included (see templates)
added-variable plot (see leverage plot)
adjusted means (see least squares means)
A-efficiency (D-optimal designs), DOE, Custom Design
AIAG labels—variability chart option, Variability/Gage Chart
AIC, Akaike’s ‘A’ Information Criterion, Fit Model Stepwise
Alias matrix—shows bias from two-factor interactions not in the model, Custom Design DOE
aliasing structure table—shows confounding patterns
all possible regressions—Fit Model Stepwise
alpha level specification (optional in many platforms)
analysis of covariance—same slopes, Fit Model SLS
analysis of covariance—separate slopes, Fit Model SLS
analysis of loglikelihood, likelihood ratio—Chi-square test of how well categorical model fits, Fit Y by X categorical, Fit Model Nominal or Ordinal Logistic
analysis of variance (general)—profile, contrasts, custom tests, crossed, nested, polynomial, surface and random effects, LSMeans, student’s t and Tukey tests for multiway ANOVA, mixed models (with no assignable covariance structure) using REML estimation, Fit Model
analysis of variance (one-way)—F test (or t-test if there are only two levels), Fit Y by X oneway
analysis of variance ( non-parametric)—Wilcoxon, Median and Van der Waerden tests, Fit Y by X oneway
animation of statistical graphics—JSL application (see scripting language, some scripts built in
ANOVA (see analysis of variance), Fit Y by X, Fit Model
ANCOVA (see analysis of covariance), Fit Model
AR coefficients plot and values—diagnostic for time series modeling, Modeling > Time Series
ARIMA and seasonal ARIMA forecasting (see time series modeling and forecasting), Modeling > Time Series
attribute charts—p, np, c, and u control charts, Control Chart
attribute gage charts
augmented designs—replicate, add center or axial points, foldover designs, DOE, Augment Design
autocorrelation—Durbin Watson test for autocorrelation, Fit Model SLS
autocorrelation plots and values—diagnostic for time series modeling, Modeling > Time Series
auto fill data tables with constant, pattern or random data
automatic derivatives (formula displayed)—nonlinear regression, Modeling > Nonlinear
automation of JMP—most of JMP can be driven by OLE automation or the JMP Scripting Language (JSL)
average linkage—cluster method, Multivariate Methods > Cluster
axial points—response surface designs or augmented, DOE, Response Surface Design
axis scaling—option to scale X and Y in most plots
axis scaling—option for central composite design, DOE, Response Surface Design

B

backpropogation—Modeling > Neural Net
bar chart—Chart option
Bartlett’s test for homogeneity of variance, Fit Y by X oneway
Bayes plot (Box-Meyer)—screen for active effects in regression model, Fit Model
Bayesian D-optimal design—DOE, Custom Design
beta fit (see fitting distributions)
between& within charts (see presummarize charts)
Bias report—Variability/Gage Chart
biplot (Gabriel)—3-D plot of principal components and variables, k-means clusters, Spinning Plot, Multivariate Methods > Cluster
binomial fitting—Distribution
bivariate fitting—fit mean, linear, polynomial, transformed values, spline, density ellipses, orthogonal, other (regression and curve fitting), Fit Y by X
Box-Behnken—(DOE), Response Surface Design
Box-Cox power transformation—screening designs and factor profiling, Fit Model
Box-Jenkins time series analysis, Modeling > Time Series
Box-Meyer Bayesian analysis (Bayes plot)—Fit Model
Box-Wilson response surface design (DOE), Response Surface Design
box plot—individual distribution (see quantile box plot and outlier (box & whiskers) box plot), Distribution
box plot option—displays sample distributions on means, Fit Y by X oneway, Control Charts
Brown-Forsythe test for homogeneity of variance, Fit Y by X oneway
Brown-Mood k-sample median test nonparametric test to compare group means, Fit Y by X oneway
By-group processing—process by groups, graphs and analyses appear in one window, no presorting data

C

calculator—(formula editor)
calibration—see inverse prediction and orthogonal regression
canonical correlation—save canonical Ys as a new data table column, Fit Model Manova
canonical centroid plot—shows points and multivariate means in the two dimensions that best separate the groups, Fit Model Manova
capability analysis—long term and short term indices, out of spec as percent and as parts per million, (PPM), Shewhart chart, histogram, quantile plot, one or more capability estimates s: long term, specified, short term grouped by fixed subgroup size, short term grouped by column, Sigma Quality (also call Process Sigma) included as a hidden column in report, Distribution
categorical analysis, two-way—contingency table for two categorical variables, two-way frequency table with count, total%, row%, col%, expected, deviation, and cell Chisq, Fit Y by X categorical
categorical model fit—nominal or ordinal response, analysis of loglikelihood Chi-square, Fit Model
cause-and-effect diagrams (see Diagram)
cell plot—displays data table cells as a matrix of rectangular colors, Cell Plot
censored data—right and left censoring, arbitrary censoring, survival analysis, nonlinear fitting, Survival and Reliability, Modeling > Nonlinear
central composite designs, DOE, Response Surface Design
centroid method—Multivariate Methods > Cluster
centroid plot—Fit Model MANOVA
chart—stack or overlay, bars, lines, needles; horizontal, vertical, pie chart, means with standard error bars
Chi-square tests—fitted distributions, Distribution
Chi-square tests—for general categorical response models, Wald and Likelihood ratio, Fit Model
Chi-square nonparametric tests—Wilcoxon, Median, Van der Waerden, Fit Model
Chi-square statistic—Likelihood Ratio, Pearson’s for two-way tables, Fit Y by X categorical
cluster analysis—hierarchical, k-means, normal mixtures clustering, geometric scale, color map, dendrogram, Self Organizing Maps (SOMS), save cluster hierarchy, biplots available for k-means cluster, Multivariate Methods > Cluster
Cochran-Mantel-Haenszel for testing association of X and Y variables across groups, Fit Y by X categorical
coefficient of variation (CV)— hidden column in Moments table and in REML and EMS results, available in data table using the Summary command, Distribution
collinearity—leverage plots show when model factors are linear combinations of others, Fit Model SLS
comparison circles—graphically shows one-way multiple comparisons, Fit Y by X Anova
competing risk analysis, competing causes analysis or recurrence analysis—Survival and Reliability
complete linkage clustering method—Multivariate Methods > Cluster
concatenate—append JMP data tables end to end
confidence curves—on scatterplot (individual and mean) for regression fits, optionally specify alpha level, Fit Y by X bivariate
confidence limits, individual and mean—for mean and standard deviation, save as new data table column, for inverse prediction, for nonlinear fitting
confounding—DOE aliasing report, Screening Design
confounding—shows if terms in a model are linearly related in DOE, singularity details table in Fit Model
contingency tables—see categorical analysis, two-way
contour plots—equal probability contours from 2-dimensional density estimation, Fit Y by X bivariate
contour plots—contours with labels, legends, color fills, predicted response within a ternary plot, response surface model effects, Contour Plot
contour profiler (overlayed contour plots)—Fit Model SLS, also Graph > Contour Profiler
contrasts—test a linear combination of parameters in a general linear model, Fit Model SLS
control charts—Shewhart charts (Mean, R, S, and Individual Measurement charts), UWMA and EWMA moving average charts, Cusum (Cumulative Sum) charts with V mask, charts for attribute data, p, np, c and u, Presum, Run, Levey-Jennings, Control Charts
Cook’s D—influence statistics, save as a new data table column, Fit Model SLS
coordinate exchange algorithm—create custom D-optimal designs, DOE, Custom Design
Correlation—bivariate scatterplot with density ellipses and report, Fit Y by X bivariate
correlation—many variables, pairwise report with significance probabilities, histogram of correlations (Pearson’s R, Spearman’s Rho, Kendall’s Tau, Hoeffding’s D), inverse correlation, partial correlation, scatterplot matrix with density ellipses, Multivariate Methods > Multivariate
correspondence analysis—graph for categorical model shows which rows and columns are similar in a two-way contingency, Fit Y by X categorical
Cotter designs—DOE, Screening Design
covariance—covariance matrix, Multivariate Methods > Multivariate
Cox proportional hazards model, Fit Model, Survival/Reliability > Proportional Hazard
Cp—selection of stepwise model (Mallow’s Cp) Fit Model Stepwise
Cramer-von Mises W statistic— goodness of fit statistic for one-way distribution fitting, Distribution
Cronbach’s alpha and standardized alpha—based on average correlation of items (item reliability analysis), Multivariate Methods > Multivariate
crosstabs—see categorical analysis, two-way
cube plot—DOE, Screening Design
cumulative distribution function (CDF) plot, for distribution fits, Distribution
cumulative logistic probability plot—logistic regression, Fit Y by X logistic
cumulative sum chart—Cusum control chart with V mask, Control Charts
curve fitting—bivariate fitting of line, polynomials, spline, and density ellipses, curves from a nonlinear fit, smooth curve fitting of histograms ° distribution fitting of histograms, Fit Y by X bivariate
Custom Design—create custom designs for both standard and nonstandard design situations, DOE, Custom Design
custom loss function—maximum likelihood estimation in nonlinear regression, Modeling > Nonlinear
custom tests—construct specialized tests for general linear model hypotheses, Fit Model SLS

D

data entry—key in data, paste from clipboard, import data, access other databases
D-efficiency, D-optimal designs—DOE, Custom Design
decision tree—see Partition
DPU—defect per unit analyses calculate and compare defect rates across and within groups, Graph > pareto plot
Deming regression—see orthogonal regression
dendrograms—cluster diagram, Multivariate Methods > Cluster
density ellipse with two variables—visualization of correlation, Fit Y by X bivariate
density ellipses, scatterplot matrix for many variables— visualization of correlation, Multivariate Methods > Multivariate
density estimation—distribution fit on histogram, equal probability contours on bivariate scatterplot, Distribution and Fit Y by X bivariate
derivatives—nonlinear regression, Modeling > Nonlinear
DOE (Design of Experiments)—commands build experimental designs for almost every situation
desirability profiling—prediction profile, helps visualize and optimize the response at different factor settings, optimize screening, response surface, and mixture designs, DOE, Custom Design and Fit Model SLS
Diagram—produces ishikawa charts, fishbone charts, cause-and effect diagram, Diagram
discriminant analysis—compute discriminant scores, classify points, save discriminant scores, optional stepwise selection, canonical plots, Multivariate Methods > Discriminant
distribution fitting—fitting, graphing, capability analysis, quantile plots for distributions: Beta, Normal, Lognormal, 2 & 3 parameter Weibull, Extreme Value, Gamma and Exponential, Binomial, Poisson, p value and power animations, tolerance Intervals computed, Distribution
Duncan’s multiple comparison test—not available, see Tukey-Cramer
Dunnett’s test—tests multiple comparison to a control group, Fit Y by X one-way
Durbin Watson test—test that residuals are autocorrelated, Fit Model SLS

E

E matrix—multivariate models Fit Model Manova
ED50 & LD50—nth percentile with confidence limit using logistic regression and inverse prediction, Fit Model SLS and Fit Y by X bivariate
editing table—standard Edit Menu commands
effect screening—scaled estimates, normal plot, Bayes plot, Pareto plot, Fit Model SLS
eigenvalues, eigenvectors—Fit Model SLS, response surface analysis
ellipses—bivariate density, Fit Y by X and Multivariate Methods > Multivariate
errors in measurement (see orthogonal regression)
EWMA control chart—guards against small shifts in sample means, quality control, Control Chart
Expected Mean Squares (EMS)—Fit Model SLS
experimental design—see DOE
exponential exploratory plot—Survival and Reliability
exponential fit — fitting distributions, Distribution
exponential model fitting—nonlinear regression with loss function, Modeling > Nonlinear
exponential smoothing time series forecasting— Modeling > Time Series
exponential survival curve analysis (see survival analysis)
export JMP tables (Linux)— Save As command for tab delimited text file, SAS transport, Open Office Spreadsheet
export JMP tables (Macintosh)— Save As command for tab delimited text file, SAS transport files, Excel file
export JMP tables (Windows)—Save As command for tab delimited text file, SAS transport, SAS datasets, JMP file, Excel, ODBC compliant package and Access
extreme value distribution fitting—nonlinear regression with loss function, Modeling > Nonlinear
extreme vertices design—DOE, range and linear constraints, general constraints with JSL, Mixture Design