Select Help > Sample Data Library and open Variability Data/Wafer.jmp.
Select Analyze > Quality and Process > Measurement Systems Analysis.
Assign Y to the Y, Response role.
Assign Wafer to the Part, Sample ID role.
Assign Operator to the X, Grouping role.
Notice that the MSA Method is set to EMP, the Chart Dispersion Type is set to Range, and the Model Type is set to Crossed.
Average and Range Charts
Parallelism Plot
Test-Retest Error Comparison
Bias Comparison
EMP Results
Shift Detection Profiler
Explore your ability to detect a shift in the mean of two part standard deviations in the 10 subgroups following the shift. Click the Part Mean Shift value of 2.1701 and change it to 4.34 (2.17 multiplied by 2). The probability of detecting a shift of twice the part standard deviation is 56.9%.
Next, see how eliminating bias affects your ability to detect the shift of two part standard deviations. Change the Bias Factors Std Dev value from 1.1256 to 0. The probability of detecting the shift increases to 67.8%.
You can also explore the effect of using a control chart based on larger subgroup sizes. For subgroup sizes of two or more, the control chart is an X-bar chart. Change the Bias Factors Std Dev value back to 1.1256 and deselect all but the first test. Set the Subgroup Size in the profiler to 4. The probability of detecting the two part standard deviation shift is 98.5%.
Effective Resolution

Help created on 9/19/2017