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1.
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Leave Alpha as 0.05 (the chance of failing the test if the new process is as good as the target).
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2.
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Enter 4 as the Baseline Counts per Unit, indicating the target of 4 defects per wafer.
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3.
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Enter 1 as the Difference to detect.
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4.
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Enter a power of 0.9, which is the chance of detecting a change larger than 1 (5 defects per wafer). In this type of situation, alpha is sometimes called the producer’s risk and beta is called the consumer’s risk.
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5.
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Click Continue to see the results in Window For Counts Per Unit Example, showing a computed sample size of 38 (rounded to the next whole number).
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