JMP 13.2 Online Documentation (English)
Discovering JMP
Using JMP
Basic Analysis
Essential Graphing
Profilers
Design of Experiments Guide
Fitting Linear Models
Predictive and Specialized Modeling
Multivariate Methods
Quality and Process Methods
Reliability and Survival Methods
Consumer Research
Scripting Guide
JSL Syntax Reference
JMP iPad Help
JMP Interactive HTML
Capabilities Index
JMP 12 Online Documentation
Profilers
•
Simulator
• Defect Parametric Profiler
Previous
•
Next
Defect Parametric Profiler
The defect parametric profiler shows the impact of process changes on the defect rate. The impacts are based on the simulation parameter settings for each factor. Four scenarios are considered.
Mean shift
The impact of shifting the mean is shown by a red curve. The current mean is shown by a red dotted vertical line.
Std Narrow
The impact of a reduction in variability is shown by a blue curve. The dotted blue vertical lines are set at the mean plus and minus one standard deviation. The minimum on the curve corresponds to the defect rate when there is no variability.
LSL Chop
The impact of inspection to remove all parts below the lower specification limit is shown a green curve.
USL Chop
The impact of inspection to remove all parts above the upper specification limit is shown an orange curve.
Defect Parametric Profile
Previous
•
Next
Help created on 9/19/2017