This example uses the Failure.jmp sample data table, which contains failure data and a frequency column. It lists causes of failure during the fabrication of integrated circuits and the number of times each type of defect occurred. A threshold value of 2 is specified for this example.
1.
Select Help > Sample Data Library and open Quality Control/Failure.jmp.
2.
Select Analyze > Quality and Process > Pareto Plot.
3.
Select failure and click Y, Cause.
4.
Select N and click Freq.
5.
Select Threshold of Combined Causes and then select Count.
7.
Figure 11.8 Pareto Plot with a Threshold Count of 2
Figure 11.8 displays the plot after specifying a count of 2. All causes with counts 2 or fewer are combined into the final bar labeled 4 Others.
Figure 11.9 Pareto Plot with Separated Causes

Help created on 10/11/2018