Shows or hides a goal plot for the data. The Goal Plot shows the spec-normalized mean shift on the x-axis and the spec-normalized standard deviation on the y-axis for each variable. See Goal Plot for more information.
Reorders the box plots, summary reports, and individual detail reports. You can reorder by Initial Order, Reverse Initial Order, Within Sigma Cpk Ascending, Within Sigma Cpk Descending, Overall Sigma Ppk Ascending, or Overall Sigma Ppk Descending.
The Individual Detail Reports option displays a capability report for each variable in the analysis. Individual Detail Report shows the Individual Detail Report for PNP1 from the Semiconductor Capability.jmp sample data table as described in Example of the Process Capability Platform.
Individual Detail Report
Show Spec Limits shows or hides vertical red lines on the histogram at the specification limits for the process.
Show Target shows or hides a vertical green line on the histogram at the process target.
Show Within Sigma Density shows or hides an approximating normal density function on the histogram with mean given by the sample mean and standard deviation given by the within estimate of sigma.
Show Overall Sigma Density shows or hides an approximating normal density function on the histogram with mean given by the sample mean and standard deviation given by the overall estimate of sigma.
Show Count Axis shows or hides an additional axis to the right of the histogram plot showing the count of observations.
Show Density Axis shows or hides an additional axis to the right of the histogram plot showing the proportion of observations.
Within Sigma Capability shows or hides capability indices (and confidence intervals) based on the within (short-term) sigma.
Within Sigma Z Benchmark shows or hides Z benchmark indices based on the within (short-term) sigma.
Overall Sigma Capability shows or hides capability indices (and confidence intervals) based on the overall (long-term) sigma.
Overall Sigma Z Benchmark shows or hides Z benchmark indices based on the overall (long-term) sigma.
The Within Sigma Normalized Box Plots and Overall Sigma Normalized Box Plots options show or hide box plots that have been normalized using the within sigma and overall sigma, respectively. When drawing Normalized Box Plots, JMP standardizes each column by subtracting off the mean and dividing by the standard deviation. The box plots are formed for each column using these standardized values.
Within Sigma Normalized Box Plot
Within Sigma Normalized Box Plot shows the Within Sigma Normalized Box Plot for a selection of the process variables in the Semiconductor Capability.jmp sample data table using wafer as a subgroup variable.
The Within Sigma Capability Summary Report and Overall Sigma Capability Summary Report options show or hide a table that contains the following statistics for each variable: LSL, Target, USL, Mean, Standard Deviation, Cpk, Cpl, Cpu, Cp, Cpm, and Nonconformance statistics. These statistics are calculated using the within sigma and overall sigma, respectively. Within Sigma and Overall Sigma Capability Summary Reports shows a subset of columns for both summary reports as described in Example of the Process Capability Platform. The following optional columns are available for this report:
Within Sigma and Overall Sigma Capability Summary Reports
The Make Goal Plot Summary Table option produces a summary data table that includes the variable’s name, its spec-normalized mean shift, and its spec-normalized standard deviation for further evaluation. Each variable has two rows in the summary table: one for each sigma type (within and overall). The points in the Goal Plot are linked to the rows in the Goal Plot Summary Table. If you apply row states to a point in the Goal Plot, you can change the corresponding row states in the Goal Plot Summary Table. Conversely, if you apply row states in the Goal Plot Summary Table, they are reflected on the Goal Plot.
Summary Table shows the Goal Plot Summary Table for the Semiconductor Capability.jmp sample data table as described in Example of the Process Capability Platform.
Summary Table