LIVE WEBINAR
Addressing Yield Challenge in Modern Manufacturing Using EDA and RCA
Date: 22 July, Tuesday
Time: 1:00-1:45 p.m. (Malaysia and Singapore) | 10:30-11:15 a.m. (India) | 3:00-3:45 p.m. (Australia)
Presenter: Kim Hui LIM
Location: Zoom Live Webinar
Registration: Free
In today’s highly competitive manufacturing environment, improving yield is not just a goal - it's a necessity. But to truly optimize production, manufacturers must move beyond surface-level metrics and uncover the real reasons behind process inefficiencies.
In this webinar, we explore how to combine exploratory data analysis (EDA) and then root cause analysis (RCA) to dig deep into your process data and identify what’s really affecting your yield. We introduce you to practical tools such as Response Screening and Predictor Screening, and show how exploratory techniques can guide you like a detective uncovering critical insights.
What you learn:
- How exploratory data analysis (EDA) acts as a problem-solving toolkit - exploring data one variable at a time, two at a time, and many at a time.
- Techniques for using graphs and visualization tools to uncover trends, patterns, and outliers.
- How to use Response Screening to analyze multiple output variables (Ys) against several inputs (Xs) to find key relationships.
- How Predictor Screening helps you focus on a single outcome (Y) and determine which inputs (Xs) matter most.
Join us now to learn how data-driven exploratory techniques and root cause analysis can uncover hidden inefficiencies and significantly boost your manufacturing yield.