LIVE WEBINAR

STDF to Insights: Automating Semiconductor Test Data Analysis in JMP

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Date: 4 Aug., Tuesday
Time: 1:00-1:45 p.m. (Malaysia and Singapore) | 10:30-11:15 a.m. (India) | 3:00-3:45 p.m. (Australia)
Presenter: Liang HUANG
Location: Zoom Live Webinar
Registration: Free

This webinar walks you through the JMP STDF Reader add-in, a purpose-built tool that transforms raw STDF V4 binary files into a complete analytical workspace inside JMP.

Whether you're running daily lot dispositions or diving deep into process capability, this session shows you how to get from raw data to actionable analysis in minutes, not hours.

Learn how to:

Parse a real multi-wafer STDF file end-to-end.
Work with analysis reports.
Standardize and scale analysis and reporting across teams.

Who should attend

This webinar is ideal for semiconductor test engineers, quality engineers, process engineers, and data analysts who work with STDF files and use JMP for statistical analysis.

No prior scripting or Python experience is required. The add-in handles the technical complexity behind the scenes.

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Register now for this free webinar!

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