ON-DEMAND WEBINAR
Fab Data, Fast Insights: Analytic Workflow for Semiconductor Engineers
Semiconductor engineers face challenges with scattered data, delayed insights, and difficulty identifying the root causes of process excursions – issues that can slow decision making and affect both yield and quality.
In this on-demand webinar, discover how JMP helps semiconductor manufacturers and Tier 1 suppliers respond faster to excursions, uncover root causes, and drive improvements in yield and quality. Learn more about JMP’s capabilities in process monitoring, interactive data visualization, predictive modeling, and workflow automation – tools that streamline decisions and scale insights across operations.
From wafer fabrication to component assembly, JMP equips teams to minimize downtime, optimize processes, and maintain high product standards in a fast-paced, data-intensive industry.
Key takeaways:
- Explore relationships, uncover patterns, and build models in one interactive JMP environment – no coding required.
- Accelerate excursion response and root cause analysis with JMP.
- Use automation to reduce manual effort and improve scalability and process transfer.
About the Presenters
Clovis Weisbart, JMP
Clark Ledbetter, JMP
Scott Wise, JMP
This session is led by Clovis Weisbart, Clark Ledbetter, and Scott Wise – seasoned JMP Systems Engineers with extensive backgrounds in semiconductor manufacturing.
Each one brings years of hands-on experience from the industry, now helping organizations apply JMP to solve complex engineering problems, automate analytics workflows, and drive measurable improvements in yield, quality, and efficiency.