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Tracking and Trending Manufacturing Metrics
Presenter: Byron Wingerd
Control Chart Overview and Using Control Chart Builder
The presenter summarizes why to use control charts to identify special causes of variation. He uses Control Chart Builder to create one and a set of control charts shows and shows how to save them to PowerPoint.
Using the Control Chart Platform
The presenter demonstrates how to build an IR Chart. He describes how to avoid issues with missing values and how to limit data points for improved readability. He introduces how to automate reproducing your work using the scripts JMP writes and by implementing techniques to make the x-axis scaling dynamic.
Selecting, Saving, Reusing and Automating, Control Limits
The presenter describes two approaches to using control limits: 1) using and reusing over time the same fixed limits based on best case when the process was in control and 2) calculating limits each time you have new data. He demonstrates how save control limits both to the column and to a new table. He gives an example of how to add control limits from a limits table to a table containing the variables for the control charts. He finishes by previewing the JMP 13 process screening platform, which can be used to quickly screen large numbers of variables for process stability.
Tuning Processes to Obtain Lowest Defect Rate (Added October 30, 2017)
The presenter shows how to use JMP Profilers to find the settings that will result in the lowest probability of defects. He shows the sequence of steps to model the process and compare maximized process settings to those for minimized defects.
Resources mentioned in these videos
- Constructing p-charts or Laney p-charts in JMP
- Journal and slides used in these videos
- Understanding Statistical Process Control, Donald Wheeler, 2010
- Statistical Quality Control, Douglas Montgomery, 2012