Best Practices in Reliability Data Analysis

Accelerated Destructive Degradation Analysis

In reliability analyses, the primary objective is to model the failure times of a product or component. But sometimes, failure data is difficult to obtain. In these situations, modeling the product’s degradation over time is helpful in making predictions about failure times. Using an example based on an adhesive, Bill Meeker, PhD, Professor of Statistics at Iowa State University, will help you gain a better understanding of:

  • When degradation analysis is appropriate.
  • How degradation data enables reliability predictions, even without actual failures.
  • How data transformations can result in a more linear and easier to interpret degradation process.
  • How modern software allows you to extrapolate failure probabilities across different "what-if" conditions.
See these techniques in action!

To learn more and see how degradation analysis can be implemented in JMP, register below.

Accelerated Destructive Degradation Analysis in JMP

Hands-on Case Study

Join JMP product manager Leo Wright as he brings Dr. Meeker’s examples to life using JMP software.

In this video, Leo Wright provides a step-by-step demonstration of how to perform accelerated destructive degradation analysis in JMP using the adhesive example introduced by Dr. Meeker.

To explore these capabilities for yourself, download JMP for free for 30 days.

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