The world of the semiconductor industry is forcing manufacturers to achieve significant reductions in time to market. As a result, every step in the manufacturing process needs to be completed in less time while maintaining a high level of control and quality.

Given the significant quantity of data collected at every stage of a manufacturing lot and the sometimes-limited statistics available to describe the problem, traditional techniques are not always adequate forresolving the issues faced by the yield engineer.

This video demonstrates a case study from the white paper: Advantages of Bootstrap Forest for Yield Analysis. The example uses partitioning techniques in JMP® Pro, namely bootstrap forest, for root-cause analysis of variation in electrical yield detected during semiconductor wafer manufacturing.

Register now for this free webinar.

*
*
*
 
 
  Please subscribe me to JMP Newswire, the monthly newsletter for JMP users.
  Yes, you may send me emails occasionally about JMP products and services. I understand that I can withdraw my consent at any time by clicking the opt-out link in the emails.

JMP Statistical Discovery LLC. Your information will be handled in accordance with our Privacy Statement.