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Pinpointing and Reducing Defects
Created: Sep 24, 2020 03:07 PM  |  Last Modified: Oct 25, 2023 03:44 PM
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See how to:

  • Reduce spatial defect data to a few key clusters
  • Correlate clusters and isolated defects to the manufacturing process in order to give direction for process improvements

 

See how to:

  • Examine multildimensional defects by going from a 2D to a 3D view of the defect
  • Visually explore 3D views using Scatterplot 3D
 Resources

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