JMP data visualization illustration - bubble plot

Quality and Process Engineering

Evaluate and improve quality, enhance process performance. 

  • Monitor your processes using Shewhart charts in a whole new way with an interactive Control Chart Builder that lets you drag and drop to explore potential root causes of variation.
  • Receive JMP® Live notifications for out-of-control signals from control chart warnings.
  • Study the capability and performance of many variables at the same time to easily identify processes that aren't meeting expectations; drill into problem processes to identify potential root causes.

Quality and Process Engineering With JMP: Highlighted Features

Statistical Process Control (Shewhart Control Chart)

  • IR
  • Xbar R
  • Xbar S
  • P
  • NP
  • C
  • U
  • EWMA
  • UWMS
  • Multivariate control chart
  • Western Electric rules
  • Tests for special causes

Process Capability (Capability Index)

  • Cp
  • Cpk
  • Pp
  • Ppk
  • Specification limits
  • Goal plot
  • Capability
  • Performance 

Quality Assessment (Process Screening)

  • Stability index
  • Quality review
  • Shift detection
  • Process performance

Measurement System Analysis (Gage R&R)

  • Evaluate Measurement Process (EMP)
  • Variability chart
  • Linearity, bias
  • Kappa
  • Agreement
  • Attribute Gage R&R
  • Variance components
  • MSA design

Quality Improvement (Six Sigma)

  • Pareto Chart
  • Cause-and-effect diagram (fishbone, Ishikawa)

Acceptance Sampling

  • OC Curves

The integrated analysis that JMP facilitates is very helpful to the way engineers think – and think critically at a high level.

Xiao Zhenglin
Organizational Excellence Training Manager, STMicroelectronics

The best discoveries start with JMP

JMP data visualization illustration - bubble plot

JMP® Analytic Capabilities

See everything that JMP® can do for you and your organization, from data access and cleaning, to exploration and visualization, all the way through sharing and communicating your results.

JMP Analytic Capabilities

Ready to take the next step?

Contact us