See approaches for analyzing measurement system variation, characterizing common causes of system variability, and establishing monitoring approaches that account for measurement system variability.
Expand Your Analytic Skills
Evaluating & Monitoring Your Process Using MSA and SPC
Gauge Repeatability and Reproducibility
The presenter gives an overview of measurement system analysis principles and uses sample data to demonstrate how to use JMP for Gauge R&R studies.
Evaluating the Measurement Process (EMP)
Learn how JMP implements Don Wheeler’s EMP method for using an interclass correlation perspective for classifying a measurement system. The presenter demonstrates how to use JMP to generate average charts, range charts, parallel plots, Shift Detection Profiler, EMP results and more to evaluate and describe the ability of a measurement system to detect product or process shifts.
The presenter describes the two phases of process monitoring: Phase 1 for characterizing the common cause variability in a system, and Phase 2 for setting up a monitoring approach to identify assignable causes with a stated level or risk. He demonstrates how to use JMP to examine Shewhart variables, rare event charts, attribute charts, multivariate charts using Hotellings T-squared distribution, and more.