Reliability demonstration test plans, or zero-failure tests, are frequently used to demonstrate that a system, subsystem or component has the required reliability. These minimum-sample size tests are attractive because they may not require a large sample size and generally have a larger probability of successful demonstration when the true reliability is much better than that to be demonstrated. Most implementations require an assumption that the Weibull shape parameter is known. View a video on this topic by Bill Meeker and a related JMP demo by Leo Wright.
This webcast is part of the Statistical Methods for Reliability with Dr. Meeker on-demand webcast series.