1. Resource Center
  2. White Paper

Advantages of Bootstrap Forest for Yield Analysis

By Youssef Baltagi, STMicroelectronics Rousset
and Florence Kussener, SAS


The world of the semiconductor industry is becoming increasingly competitive and forcing manufacturers to achieve significant reductions in time to market. As a result, every step in the manufacturing process needs to be completed in less time while maintaining a high level of control and quality.

Given the significant quantity of data collected at every stage of a manufacturing lot and the sometimes-limited statistics available to describe the problem, traditional techniques are not always adequate for resolving the issues faced by the yield engineer. This paper will delve into a number of practical ways to make use of partitioning techniques to address these challenges through two case studies.

The first involves using partitioning for root-cause identification in the case of a loss of electrical yield that is not detected during the manufacturing process; the second examines a variation in electrical yield detected during manufacturing.

*
*
*
*
  Please subscribe me to JMP Newswire, the monthly newsletter for JMP users.
  Yes, you may send me emails occasionally about JMP products and services. I understand that I can withdraw my consent at any time by clicking the opt-out link in the emails.

JMP Statistical Discovery LLC. Your information will be handled in accordance with our Privacy Statement.