The ICdevice02.jmp data shows failures that were found to have happened between inspection intervals. The model uses two y-variables, containing the upper and lower bounds on the failure times. Right-censored times are shown with missing upper bounds.
Note: The data in ICdevice02.jmp comes from Meeker and Escobar (1998, p. 640).
1.
Select Help > Sample Data Library and open Reliability/ICdevice02.jmp.
2.
Select Analyze > Reliability and Survival > Fit Parametric Survival.
3.
Select HoursL and HoursU and click Time to Event.
4.
Select Count and click Freq.
5.
Select x and click Add.
6.
Click Run.
Figure 13.12 ICDevice Output

Help created on 10/11/2018