1.
Select Help > Sample Data Library and open Quality Control > Lot Wafer History.jmp and Quality Control > Lot Wafer Yield.jmp.
2.
From the Lot Wafer History.jmp data table, select Analyze > Screening > Process History Explorer.
3.
Select Lot and Wafer and click ID.
4.
Select Tool and Route and click X, Process.
5.
Select Layer and Operation and click Step.
6.
Select TimeIn and TimeOut and click Timestamp.
7.
8.
Select Lot Wafer Yield and click OK.
9.
Select Yield and click OK.
Figure 21.2 Process History Explorer Report

Help created on 7/12/2018