Reliability and Survival Methods > Fit Life by X > Example of the Fit Life by X Platform
Publication date: 08/13/2020

Example of the Fit Life by X Platform

This example uses the Devalt.jmp sample data table, from Meeker and Escobar (1998), and can be found in the Reliability folder of the sample data. It contains time-to-failure data for a device at accelerated operating temperatures. No time-to-failure observation is recorded for the normal operating temperature of 10 degrees Celsius; all other observations are shown as time-to-failure or censored values at accelerated temperature levels of 40, 60, and 80 degrees Celsius.

1. Select Help > Sample Data Library and open Reliability/Devalt.jmp.

2. Select Analyze > Reliability and Survival > Fit Life by X.

3. Select Hours and clickY, Time to Event.

4. Select Temp and click X.

5. Select Censor and click Censor.

6. Leave the Censor Code as 1.

7. Select Weight and click Freq.

8. Keep Arrhenius Celsius as the relationship, and keep the Nested Model Tests option selected.

9. Select Weibull as the distribution.

10. Keep Wald as the confidence interval method.

Figure 4.2 Fit Life by X Launch Window 

11. Click OK.

Figure 4.3 Fit Life by X Report Window for Devalt.jmp Data 

The report window shows summary data, diagnostic plots, comparison data and results, including detailed statistics and prediction profilers. Separate result sections are shown for each selected distribution. Distribution, Quantile, Hazard, Density, and Acceleration Factor Profilers are included for each of the specified distributions.

Want more information? Have questions? Get answers in the JMP User Community (community.jmp.com).
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