Profilers > Introduction to Profilers > Introduction to Profiling
Publication date: 08/13/2020

Introduction to Profiling

It is easy to visualize a response surface with one input factor X and one output factor Y. It becomes harder as more factors and responses are added. The profilers in JMP provide a number of highly interactive cross-sectional views of any response surface. In this guide we use the following terms interchangeably.

factor, input variable, X column, independent variable, setting, term

response, output variable, Y column, dependent variable, outcome

Desirability profiling and optimization features are available to help find good factor settings and produce desirable responses. Most profilers also incorporate multithreading for faster computation. Simulation and defect profiling features are available for when you need to make responses that are robust and high-quality when the factors have variation.

Profiler Features in JMP

Profiler Launch Windows

Fit Group

Want more information? Have questions? Get answers in the JMP User Community (community.jmp.com).
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