For the latest version of JMP Help, visit JMP.com/help.

Publication date: 09/28/2021

Interval-Censored Accelerated Failure Time Model

The ICdevice02.jmp data shows failures that were found to have happened between inspection intervals. The model uses two y-variables, containing the upper and lower bounds on the failure times. Right-censored times are shown with missing upper bounds.

Note: The data in ICdevice02.jmp comes from Meeker and Escobar (1998, p. 640).

1. Select Help > Sample Data Library and open Reliability/ICdevice02.jmp.

2. Select Analyze > Reliability and Survival > Fit Parametric Survival.

3. Select HoursL and HoursU and click Time to Event.

4. Select Count and click Freq.

5. Select x and click Add.

6. Click Run.

Figure 14.12 ICDevice OutputĀ 

ICDevice Output

The resulting regression shows a plot of time by degrees.

Want more information? Have questions? Get answers in the JMP User Community (community.jmp.com).