Publication date: 05/24/2021

Interval-Censored Accelerated Failure Time Model

The ICdevice02.jmp data shows failures that were found to have happened between inspection intervals. The model uses two y-variables, containing the upper and lower bounds on the failure times. Right-censored times are shown with missing upper bounds.

Note: The data in ICdevice02.jmp comes from Meeker and Escobar (1998, p. 640).

1. Select Help > Sample Data Library and open Reliability/ICdevice02.jmp.

2. Select Analyze > Reliability and Survival > Fit Parametric Survival.

3. Select HoursL and HoursU and click Time to Event.

4. Select Count and click Freq.

5. Select x and click Add.

6. Click Run.

Figure 14.12 ICDevice OutputĀ 

ICDevice Output

The resulting regression shows a plot of time by degrees.

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