Addresses the issue of different measurement scales for continuous and ordinal columns. Except when the Data is stacked option is selected, the values in each column are standardized by subtracting the column mean and dividing by the column standard deviation. Deselect the Standardize Data check box if you do not want the cluster distances computed on standardized values.
(Available only if Data is stacked is selected as the data structure.) Select the Add Spatial Measures option when your data are stacked and contain two attribute columns that correspond to spatial coordinates (horizontal and vertical coordinates, for example). This option opens a window in which you can select which spatial components to add measures for circle, pie, and streak spatial measures to aid in clustering defect patterns. This is a specialty method and is applicable in only very specific settings. See Spatial Measures and Example of Wafer Defect Classification Using Spatial Measures.

Help created on 9/19/2017