Significance of exploratory data analysis (EDA) in Industry 4.0
During the shift from Industry 3.0 to Industry 4.0, the significance of exploratory data analysis (EDA) cannot be understated.
In this on-demand webinar, our speaker, Sufinah Dahari, is the Technical Expert at Dominant Opto Technologies; one of the leading light-emitting diodes (LEDs) manufacturers in the world offering high performance and innovative solutions for world renowned car makers.
Her deep understanding of how datasets may influence quality monitoring systems and trend charts, coupled with mastery of using JMP, resulted in the deployment of robust strategies in statistical process control charts within her organization.
In this recording, Sufinah will demonstrate:
- The roadmap from Industry 3.0 to 4.0 in the semiconductor manufacturing
- Utilization of robust statistics, specifically Huber's M-estimators
- Enhancing the Levey-Jennings chart using JSL scripting
- Incorporation of add-in features to expand JMP's functionality
- Interactive HTML reporting
Register to watch the on-demand webinar and delve into JMP’s adaptability to enhance your journey towards Industry 4.0.
Want to learn more about JMP? Send your enquiry to jmpasia@jmp.com.
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Ethics Declaration: Conflict of Interest Statement
The speaker is an employee of Dominant Opto Technologies. The speaker or Dominant Opto did not receive any financial benefit on behalf of the JMP or vice versa for this webinar. The speaker has been using JMP software since 2010/2011 throughout her working experience. Dominant Opto Technologies hold valid license of JMP software for its employees to use, and test the product. It is the speaker’s responsibility to report the assessment to her employer and not to be bias to any third party in forming an opinion. Although, the speaker provides professional opinion and technical expertise assessment related to JMP software in this webinar, Dominant Opto Technologies, its employees and customers cannot be held liable for any potential misused or misinterpretation of the material.