Publication date: 07/15/2025
Covering Array
Detecting Component Interaction Failures
Covering arrays are used in testing deterministic systems where failures occur as a result of interactions among components or subsystems. The design goal is to reveal if any interaction induces a failure in the system. Application areas include software, circuit, and network design.
Since the tests are deterministic, the emphasis driving the design is the need to cover all required interactions. The Covering Array platform constructs highly efficient covering arrays. You can also exclude factor level combinations that are not feasible for your testing protocol. Use the Bayesian Fault Localization method (BayesFLo) to analyze a completed covering array.
Figure 20.1 Strength 3 Covering Array
Contents
Overview of Covering Arrays
Example of a Covering Array
Build a Covering Array Design
Factors
Restrict Factor Level Combinations
Design
Metrics
Output Options
The Covering Array Data Table
Analysis Script
Covering Array Options
Additional Example of a Covering Array
Statistical Details for Covering Arrays
Algorithm for Optimize
Formulas for Metrics
Want more information? Have questions? Get answers in the JMP User Community (community.jmp.com).