NXP Semiconductors

Customer Story Video

At NXP Semiconductors, JMP steers fabrication towards zero defects

Senior Principal Engineer and Total Quality Practitioner Pradeep Sharma, Ph.D. details how the use of JMP has resulted in a zero-defect status for a particular manufacturing process at NXP.

Pradeep Sharma, Ph.D.

Senior Manager, Automotive Quality
NXP

Pradeep Sharma, Ph.D. works in Advanced Manufacturing Quality Program (AMQP) at NXP Semiconductors Taiwan Limited. He holds a doctorate in Nanotechnology from National Taiwan University. He started his career in failure and material analysis and reliability testing of semiconductor devices at MA-tek Inc., Hsinchu. Currently working as Six Sigma Black Belt and Total Quality practitioner in NXP, Pradeep is engaged in problem solving projects towards Zero Defect (ZD) objective of NXP. He is empowering ZD with combination of Innovation, Total Quality and Data Analytics (JMP Pro and other analysis tools).

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The results illustrated in this article are specific to the particular situations, business models, data input and computing environments described herein. Each JMP customer’s experience is unique, based on business and technical variables, and all statements must be considered nontypical. Actual savings, results and performance characteristics will vary depending on individual customer configurations and conditions. JMP does not guarantee or represent that every customer will achieve similar results. The only warranties for JMP products and services are those that are set forth in the express warranty statements in the written agreement for such products and services. Nothing herein should be construed as constituting an additional warranty. Customers have shared their successes with JMP as part of an agreed-upon contractual exchange or project success summarization following a successful implementation of JMP software.