1.
Open the Wafer.jmp sample data table.
2.
Select Analyze > Quality and Process > Measurement Systems Analysis.
3.
Assign Y to the Y, Response role.
4.
Assign Wafer to the Part, Sample ID role.
5.
Assign Operator to the X, Grouping role.
Notice that the MSA Method is set to EMP, the Chart Dispersion Type is set to Range, and the Model Type is set to Crossed.
6.
Average and Range Charts
Parallelism Plot
Test-Retest Error Comparison
Bias Comparison
EMP Results
Shift Detection Profiler
Change the parameters to see what your chances are of detecting a 3 sigma shift when only one test is selected. For the Part Mean Shift value, change 2.1701 to 6.51 (2.17 multiplied by 3). Your probability of detecting a 3 sigma shift goes up to almost 96%.
Next, change the parameters to eliminate bias and see how that affects your chances of detecting warnings. For the Bias Factors Std Dev value, change 1.1256 to 0. Your probability of detecting warnings goes up to almost 99%.
Effective Resolution