Developer Tutorial: Constant Stress Accelerated Life Testing

Accelerated Life Testing (ALT) is required for the evaluation of product reliability for parts that need to perform well for long periods. Due to low failure rates at use conditions, products must be tested under conditions that are more severe than normal to generate failures in a reasonable amount of time.  Then, the accelerated failure data is used to predict product reliability at normal use conditions. Devices requiring such reliability analyses include medical devices, semiconductor circuits, aviation equipment and more.

The new JMP 18 Constant Stress Accelerated Lifetime Testing (Constant Stress ALT) special-purpose DOE capability lets you create and evaluate multi-factor designs for up to 3 acceleration factors and then use a JMP script to launch the Fit Life by X model after the data is collected.  

The interface is easy to use to interactively identify factors and test conditions. In addition to identifying the distribution model and design settings, a new interface allows users to easily specify planning values for the underlying acceleration model. This model allows for optimizing the design based on the large-sample variance of either a lifetime quantile or failure time. After this information is specified, JMP creates three test plans: Optimal, Compromise, and Balanced.

JMP summarizes the modeling and design information for the Test Plans and gives Design Diagnostics for each plan. Diagnostics include statistics as well as three Profilers: Distribution, R-Precision Factor , and Model Sensitivity to help you choose your design(s) before creating the design with a simple button click. 

One of the key JMP Developers will demonstrate and explain the capability. The session includes time for Q&A.

This JMP Developer Tutorial covers: interactively setting up design factors and test conditions; generating and optimizing the design; choosing and inputting planning values; Interpreting Test Plan diagnostics and using Profilers to simulate the models; creating the designs; launching Fit Y by X after you have run the design(s).