Charlie Whitman is a Senior Systems Engineer at JMP Statistical Discovery, which creates interactive and highly visual statistical discovery software for scientists and engineers.
Before joining JMP, he was a Reliability Engineer at Qorvo for 20 years, leading reliability test efforts for the FAB by modeling lifetimes of semiconductor devices.
Charlie has also performed various DOEs and mentored others in statistics and reliability, ranging from statistical analysis on life data at Lucent Technologies to reliability testing of thin film resisters for inkjet printer chips at Lexmark International.
You can find Charlie on LinkedIn at https://www.linkedin.com/in/charles-whitman-1946947/