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Advantages of Bootstrap Forest for Yield Analysis: Case 2, Correlation Between EWS and PT Parameters

Advantages of Bootstrap Forest for Yield Analysis: Case 2, Correlation Between EWS and PT Parameters

This video demonstrates the second case from the white paper: Advantages of Bootstrap Forest for Yield Analysis. The example uses partitioning techniques in JMP® Pro, namely bootstrap forest, for root-cause analysis of variation in electrical yield detected during semiconductor wafer manufacturing.

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