Pinpointing and Reducing Defects  

Application Area:
Statistics, Predictive Modeling and Data Mining

Learn how to identify and reduce defects for a broad range of products, including those where the physical location of a defect is particularly important. See how to use JMP to identify and explore defects and build a causal hypothesis to help determine the next step for process improvement.

This webinar covers: hierarchical clustering, k-means clustering and adding images to tables.